Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVII. Toronto, Ontario, Canada, September 14-18, 2009CLARK, Paula A; GARDELLA, Joseph A.Surface and interface analysis. 2011, Vol 43, Num 1-2, issn 0142-2421, 683 p.Conference Proceedings

A comparison of SIMS and DESI and their complementaritiesSALTER, T. L; GREEN, F. M; GILMORE, I. S et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 294-297, issn 0142-2421, 4 p.Conference Paper

Alkaline earth metal salts of CaC0₃, BaCO₃, and SrC0₃ as matrix for tryptophan SIMS analysisSTUPAVSKA, M; ARANYOSIOVA, M; VELIC, D et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 462-466, issn 0142-2421, 5 p.Conference Paper

Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometryNINOMIYA, Satoshi; ICHIKI, Kazuya; YAMADA, Hideaki et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 95-98, issn 0142-2421, 4 p.Conference Paper

Application of TOF-SIMS to the direct determination of syringyl to guaiacyl (S/G) ratio of ligninSAITO, Kaori; KISHIMOTO, Takao; MATSUSHITA, Yasuyuki et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 281-284, issn 0142-2421, 4 p.Conference Paper

Influence of the polar angle of incidence on secondary ion formation in self-sputtering of silverWEIDTMANN, B; HANKE, S; DUVENBECK, A et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 24-27, issn 0142-2421, 4 p.Conference Paper

Investigations of secondary ion yield-enhancing methods in combinationHEILE, A; MUHMANN, C; LIPINSKY, D et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 20-23, issn 0142-2421, 4 p.Conference Paper

Modeling the interaction of keV clusters with molecular solidsMODY, Jaydeep D; WEBB, Roger P.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 92-94, issn 0142-2421, 3 p.Conference Paper

NanoSIMS50 imaging of thin samples coupled with neutral cesium depositionAUDINOT, Jean-Nicolas; CABIN-FLAMAN, Armelle; PHILIPP, Patrick et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 302-305, issn 0142-2421, 4 p.Conference Paper

Photon emission from massive projectile impacts on solidsFERNANDEZ-LIMA, F. A; PINNICK, V. T; DELLA-NEGRA, S et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 53-57, issn 0142-2421, 5 p.Conference Paper

Quantitative depth profiling of SiGe-multilayers with the Atom ProbeKOELLING, Sebastian; GILBERT, Matthieu; GOOSSENS, Jozefien et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 163-166, issn 0142-2421, 4 p.Conference Paper

SIMS analytical technique for PV applicationsPERES, P; MERKULOV, A; DESSE, F et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 643-645, issn 0142-2421, 3 p.Conference Paper

Study of charge effect during Cs⁺ sputtering of polystyrene in the pre-equilibrium regimeWAHOUD, F; MOUHIB, T; AUDINOT, J.-N et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 201-203, issn 0142-2421, 3 p.Conference Paper

Surface and interface analysis of iodine-doped pentacene structures for OTFTsJAKABOVIC, J; VINCZE, A; UHEREK, F et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 518-521, issn 0142-2421, 4 p.Conference Paper

Surface morphology of PMMA surfaces bombarded with size-selected gas cluster ion beamsICHIKI, K; NINOMIYA, S; NAKATA, Y et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 120-122, issn 0142-2421, 3 p.Conference Paper

TOF-SIMS analysis of media lubricant under laser irradiation for HAMR applicationRONG JI; JIANWEI XU; LIEW, Thomas et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 406-409, issn 0142-2421, 4 p.Conference Paper

Temperature effects in the sputtering of a molecular solid by energetic atomic and cluster projectilesBRENES, D. A; WILLINGHAM, D; WINOGRAD, N et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 78-80, issn 0142-2421, 3 p.Conference Paper

The control of surface segregation of blend films using stereocomplex formation between enantiomeric polylactide chainsLEE, Won-Ki; WELLS, David D; GOACHER, Robyn E et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 385-388, issn 0142-2421, 4 p.Conference Paper

ToF-SIMS analysis of myocardial infarcted tissuePARK, Ji-Won; CHA, Min-Ji; HYUN KYONG SHON et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 350-353, issn 0142-2421, 4 p.Conference Paper

A beneficial application of backside SIMS for the depth profiling characterization of implanted siliconFUJIYAMA, N; HASEGAWA, T; SUDA, T et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 654-656, issn 0142-2421, 3 p.Conference Paper

A new time-of-flight SIMS instrument for 3D imaging and analysisHILL, Rowland; BLENKINSOPP, Paul; THOMPSON, Stephen et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 506-509, issn 0142-2421, 4 p.Conference Paper

Analysis of organic multilayered samples for optoelectronic devices by (low-energy) dynamic SIMSNGO, K. Q; PHILIPP, P; JIN, Y et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 194-197, issn 0142-2421, 4 p.Conference Paper

Depth Profiling of Anodic Tantalum Oxide Films with Gold Cluster IonsPOERSCHKE, David; WUCHER, Andreas.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 171-174, issn 0142-2421, 4 p.Conference Paper

Depth profiling by cluster projectiles as seen by computer simulationsPOSTAWA, Z; RZEZNIK, L; PARUCH, R et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 12-15, issn 0142-2421, 4 p.Conference Paper

Development of an energy-resolved method for SIMS in-depth analysis of metal-polymer interfacesTELLEZ, Helena; VADILLO, José M; LASERNA, J. Javier et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 632-634, issn 0142-2421, 3 p.Conference Paper